Reliably counting atomic planes of few-layer graphene (n > 4).

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Published in ACS Nano on December 07, 2010

Authors

Yee Kan Koh1, Myung-Ho Bae, David G Cahill, Eric Pop

Author Affiliations

1: Department of Materials Science and Engineering, and Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801, United States. mpekyk@nus.edu.sg

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