Influence of post-annealing on the off current of MoS2 field-effect transistors.

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Published in Nanoscale Res Lett on February 11, 2015

Authors

Seok Daniel Namgung1, Suk Yang1, Kyung Park2, Ah-Jin Cho1, Hojoong Kim1, Jang-Yeon Kwon1

Author Affiliations

1: School of Integrated Technology, Yonsei University, Songdo-dong, Incheon, 406-840 Republic of Korea ; Yonsei Institute of Convergence Technology, Incheon, 406-840 Republic of Korea.
2: Yonsei Institute of Convergence Technology, Incheon, 406-840 Republic of Korea.

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